What is "Live FIB"
Our unique Live Focused Ion Beam service is you sit at your home watching our talented engineer operating FIB on your chip, you can supervise the operation from the moment it enter the FIB chamber and the whole process, you can even record the whole FIB operation including HD FIB monitor screen, Ion Beam scanning screen and the FIB Chamber.
Our FIB & SEM Service Advantage
A). We are from China, we have better price.
B). Far away from you, your project is much confidential with us.
C). Have 20+ years of experience in serving the semiconductor reverse engineering sector.
Focused ion beam FUNDAMENTAL
Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. A FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM). However, while the SEM uses a focused beam of electrons to image the sample in the chamber, a FIB setup uses a focused beam of ions instead. FIB can also be incorporated in a system with both electron and ion beam columns, allowing the same feature to be investigated using either of the beams. FIB should not be confused with using a beam of focused ions for direct write lithography (such as in proton beam writing). These are generally quite different systems where the material is modified by other mechanisms.